System description
The new table top system ALBATROSS-TT (3D-Arrangement for Laser Based Transmittance, Reflectance and Optical Scatter measurement – Table Top) enables high sensitive measurements of angle resolved light scattering, reflectance and transmittance of optical and non-optical surfaces, materials and components within the entire 3D-sphere.
Applications
Characterization of surfaces, coatings, and materials:
- Quality control, appearance
- Optical performance
- Roughness analysis
Specifications
- Measurement of light scattering (ARS,BRDF, BTDF, scatter loss), θ-2θ, R and T
- Full 3D-spherical measurement capability
- In- and out-of-plane mode
- Flexible variation of incident angle, scattering angle (azimuth and polar angles), and polarization
- Area raster scans of sample surface
- Housed table top system (< 1 m³)
- Dynamic range: 13 orders of magnitude
- Noise equivalent ARS: 3x10-08 sr-1
- Roughness equivalent sensitivity: < 0.1 nm
- Wavelength: 405 nm, 532 nm, and 640 nm (other wavelengths on demand)
- User-friendly software for measurement control and data analysis
- Analysis tools: roughness, PSD, etc.